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Détection de la fatigue au volant
LAMBERT A., BARTH C., SONI A., SOUKANE A., HINA M., RAMDANE-CHERIF A., Techniques de l'ingénieur, 2023
Impact of carrier injection in 2.2 nm-thick SiO2 oxides after first and substrate enhanced electron injection
BARTH C., Trapes C., Goguenheim D., Bravaix A., Journal of Non-Crystalline Solids, 2003, vol. 322, no. 199-205
Voir la publicationCarrier injection efficiency for the reliability study of 3.5–1.2 nm thick gate-oxide CMOS technologies
BARTH C., Bravaix A., Trapes C., Goguenheim D., Revil N., Vincent E., Microelectronics Reliability, 2003, vol. 43, no. 1241-1246
Voir la publicationUltra thin oxide reability after combined constant voltage stress ans substrate hot electron injection
Journal of Non-Crystalline Solids, vol. 351, no. 1860-1865
experimental extraction of degradation parameters after constant voltage stress and substrate hot electron injection on ultra thin oxides
Microelectronics Reliability, vol. 45, no. 883-886
Elaboration et caractétisation de nanocapteurs
Techniques de l'ingénieur, vol. RE65, no. 1-8